Home ANRITSU | Bit Error Rate Testers BERTWave™ MP2110A
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ANRITSU | Bit Error Rate Testers

BERTWave™ MP2110A

The BERTWave™ MP2110A is an advanced all-in-one instrument combining a 4-channel Sampling Oscilloscope and Bit Error Rate Tester (BERT) designed for testing 10G to 800G optical modules. It provides fast, high-performance measurements, enabling efficient manufacturing inspection and R&D of optical devices, improving test times and reducing infrastructure costs..

  • Detail
  • Special Features
  • Specification

The BERTWave™ MP2110A is engineered for optical module testing with a focus on high-speed, multichannel applications. Ideal for evaluating devices ranging from 10G to 800G, it ensures that the testing process is streamlined and efficient. The built-in sampling oscilloscope offers precise measurement capabilities with high sensitivity, wide bandwidth, and low jitter, making it a suitable tool for both R&D and manufacturing inspection of optical components.

  • Fast Measurement and High Sensitivity: Capable of sampling 250 ksamples/s, the MP2110A ensures that 1 Msamples can be captured in as little as 5 seconds.

  • Flexible Signal Analysis: It supports both NRZ and PAM4 signals, and comes with a built-in Clock Recovery Unit for 53-Gbaud analysis.

  • Advanced Jitter and Signal Quality Analysis: 200 fs rms jitter measurement ensures high accuracy for signal integrity testing.

  • Comprehensive Application Support: The MP2110A is perfect for testing SFP28, QSFP28, CFP2/4/8, and other high-speed optical transceiver modules, as well as Active Optical Cables (AOC), Direct Attach Cables (DAC), and more.

This BERT and Sampling Oscilloscope combo is an ideal choice for companies involved in high-performance optical transport modules, including Ethernet, eCPRI/RoE, CPRI, and Fibre Channel testing.

  • Integrated Design: Combines a 4-channel Sampling Oscilloscope and 4-channel BERT for compact, efficient testing.

  • High-Speed Performance: Capable of fast measurements with 250 ksamples/s, achieving 1Msamples in 5 seconds.

  • Wide Bandwidth: Supports 35 GHz for SMF optical, 25 GHz for MMF optical, and 40 GHz for electrical signals.

  • Low Jitter: 200 fs rms jitter for precise measurements.

  • PAM4 Support: Compatible with NRZ and PAM4 signals, enabling 53-Gbaud analysis.

  • Clock Recovery: Built-in 26/53 Gbaud Clock Recovery Unit (CRU) for both NRZ and PAM4.

  • Jitter Component Analysis: Detailed jitter analysis for NRZ signals.

  • Multichannel Testing: Designed for the evaluation of 10G to 800G optical transport modules, optical cables, and components used in data centers, 4G/5G networks, and more.

  • Bandwidth: 35 GHz (SMF Optical), 25 GHz (MMF Optical), 40 GHz (Electrical)

  • Jitter: 200 fs rms (typical)

  • Speed: 250 ksamples/s (measures 1 Msamples in ~5 seconds)

  • Clock Recovery Unit: 26/53 Gbaud (NRZ and PAM4)

  • Measurement: NRZ Jitter component analysis

  • Testing: 10G to 800G optical transport modules, optical cables, and associated parts

  • Supported Modules: SFP28, QSFP28, CFP2/4/8, SFP56, QSFP56, OSFP, QSFP-DD

  • Supported Applications: Data centers, 4G/5G mobile networks, core/metro networks, etc.